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3120A Phase noise short stability analysis box

3120A Phase noise short stability analysis box
Phase noise short st

Stability measurement, phase noise measurement quote

Product Description

Microsemi (acquired Symmetricom) has developed direct digital phase noise measurement technology, which has now been extended to a test probe. Accurate phase noise and Allan variance measurements are achieved at a significantly reduced cost.
 
The 3120A from Microsemi (acquired Symmetricom) is a high-performance test probe that measures the amplitude, phase, and frequency stability of RF source ports and dual-port devices (frequency: 0.5 MHz to 30 MHz).

The test capabilities of the 3120A include:

Key Features

● Real-time "Strip Chart" of phase and frequency differences with sub-picosecond (ps) accuracy
● Absolute frequency counting up to 13+ digits per second, with a maximum of 17 digits (upgrade option)
● Allan deviation (ADEV) typically less than 1E-13 (t=1s)
● Improved Allan deviation (MDEV), Hadamard deviation (HDEV), and time deviation (TDEV) (upgrade option)
● RMS integrated phase noise and phase noise offset:
   - 1 Hz to 100 kHz, levels below -170 dBc/Hz (upgrade option)
   - AM noise offset: 1 Hz to 100 kHz, <-170 dBc/Hz (upgrade option)
   - RMS integrated jitter with time jitter below 100 fs and residual jitter: 1 Hz to 100 kHz (upgrade option)

Key Advantages

● Quick display of test results within seconds
● Support for testing with different input and reference frequencies
● Cost-effective solution
● No calibration required for measurements, saving time
● User-friendly software with intuitive graphical user interface
● Compact size
 
Overall, the 3120A offers a high-performance and cost-effective solution for accurate phase noise and frequency stability measurements. With its compact size and easy-to-use software, it provides efficient and reliable testing capabilities.
 
 

 

Key Features

● Independent input and reference frequencies: 0.5 MHz to 30 MHz
● Cross-correlated testing of PM noise offset: 1 Hz to 100 kHz
● Allan deviation (ADEV) typically < 1E-13 (t=1s)
● SFDR specified as -100 dBc, typically lower than -120 dBc
● Frequency and phase difference plots with a million+ points to depict oscillator drift
● Includes digital I/O expansion ports and independent ADCs input
● User-friendly measurement software with full multithreaded high-performance measurements
● ASCII file format with flexible options for data import and export
 

Optional Features (Software Upgrades)

● AM noise
● Signal statistics for MDEV, HDEV, TDEV, and jitter measurements
● Frequency counter licensing agreement
● Template testing license
● All supported measurements have user-definable limit lines
 
The 3120A requires a PC host and an externally provided reference oscillator. The accuracy, repeatability, background noise, and spurious response of almost all aspects of measurement performance depend on the ability to provide the best reference signal, such as using a dedicated low-noise OCXO for phase noise and amplitude noise measurements.
 
Overall, the 3120A offers a comprehensive set of features including independent input and reference frequencies, PM noise correlation testing, accurate Allan deviation measurements, SFDR specifications, and flexible data import/export options. The user-friendly software and optional upgrades further enhance its measurement capabilities.
 

Technical Specifications:

 


Documentation

3120A Phase noise short stability analysis box【PDF】data
PDF

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